Universität Tübingen

Institut für Angewandte Physik


Research Activities of the Working Group "Nanostructuring and Nanodevices"

The working group on "Nanostructuring and Nanodevices" has been established in January 1994. The research activities concentrate on the development of new technologies for the realization of nanostructures as well as on the development of new nanoelectronic devices.

Nanostructuring
The work in this group focuses on electron beam lithography. In particular low energy electron beam lithography is under development. At low energies, backscattering effects in lithography are negligiable. However, due to the small penetration depth of the low energy electrons only thin resist layers can be exposed. Therefore, new pattern transfer technologies have to be developed. A new fast Pattern Generator for the generation of arbitrairy shapes for electron beam lithography is also under construction. These technologies can be applied in the parallel e-beam lithography using an array of micro columns . This technique would enhance the throughput of electron beam lithography systems considerably. Such an array is also being developed in this working group.

Nanodevices
Scaling of conventional MOSFET devices has been an enormously successful approach to achieve higher speeds and increased functional densities. For both fundamental and practical reasons this cannot continue indefinitely. The need to find a candidate successor technology capable of being scaled down drives investigations of various quantum-based alternatives.
In the working group several nanoelectronic devices are realized and characterized.

  • Electron Wave Switch
  • Single Electron Memory
  • Quantum Cellular Automata

     

    Facilities
    From the establishment of the working group on, a clean room laboratory with nanostructuring facilities has been equipped with the following tools:

  • High Resolution Electron Beam Lithography
  • Optical Lithography
  • Scanning Electron Microscopy
  • Reactive Ion Etching
  • Thermal Oxidation
  • PECVD of SiOx and SixNy
  • Thermal and Electron Gun Evaporator
  • Sputtering
  • Bonding

    The devices can be characterized in a Helium cryostate with magnetic fields up to 10 Tesla.


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    freek.prins@uni-tuebingen.de(freek.prins@uni-tuebingen.de) - Stand 10. August 1996